What is the difference between eds and edx

The minimum detection limits vary from approximately 0. Quantitative Analysis - Quantitative results can be obtained from the relative x-ray counts at the characteristic energy levels for the sample constituents. Semi-quantitative results are readily available without standards by using mathematical corrections based on the analysis parameters and the sample composition. The accuracy of standardless analysis depends on the sample composition.

Greater accuracy is obtained using known standards with similar structure and composition to that of the unknown sample. Elemental Mapping - Characteristic x-ray intensity is measured relative to lateral position on the sample. Variations in x-ray intensity at any characteristic energy value indicate the relative concentration for the applicable element across the surface.

One or more maps are recorded simultaneously using image brightness intensity as a function of the local relative concentration of the element s present. Line Profile Analysis - The SEM electron beam is scanned along a preselected line across the sample while x-rays are detected for discrete positions along the line. Analysis of the x-ray energy spectrum at each position provides plots of the relative elemental concentration for each element versus position along the line. Samples up to 8 in.

Larger samples, up to approximately 12 in. A maximum sample height of approximately 2 in. Samples must also be compatible with a moderate vacuum atmosphere pressures of 2 Torr or less.

Download PDF Print this page. Featured Case Study view Leaking Chemical Storage Tank: A chemical storage tank at a manufacturing facility began to leak allowing trace quantities of the chemical to leak from the tank into the chemical containment area surrounding the tank. This beam interacts with the atom, displacing an electron out of its shell leaving behind a void. Another electron from a higher energy level fills this void in the lower orbital. The energy released during this event is relative to the number of shells the replacement electron has displaced from its original location, and to what shell the electron moves.

This energy is emitted as x-rays, which are converted into voltage by the detector. The resulting data consists of counts corresponding to the number of x-rays at each energy level. The energy level of the emitted x-rays correlates to individual elements, while the proportional counts relates to the quantity of the element. The cumulative spectrum of the emission energies for an element is unique to that element so it can be used to identify unknown particles in a sample or determine sample composition.

EDS technology from Particle Technology Labs is useful for analyzing the elemental composition of sample material for elements of atomic mass 12 Carbon and up, and can also be used to quantify the elemental composition of a sample. Results can be used for foreign material identification, process troubleshooting, deformulation, among other uses.